Autors: Angelov, G. V., Bonev N., Rusev, R. P., Hristov, M. H. Title: Surface Potential Model of a High-k HfO2-Ta2O5 Capacitor Keywords: Device modeling, compact models, PSP, circuit simulation, hi Abstract: A compact model of a MOS capacitor with high-k HfO2–Ta2O5 mixed layer stack is developed in Matlab. Model equations are based on the surface potential description of PSP model. After fitting the C–V characteristics in Matlab the model is coded in Verilog-A hardware description language to interface with Spectre circuit simulator within Cadence CAD system. The results are validated against experimental measurements of high-k dielectric structure. References Issue
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Цитирания (Citation/s):
1. N. Bonev, H. Hristov and M. Hristov, "Mechanical stress impact on CMOS low supply voltage bangap reference circuit," 2016 International Semiconductor Conference (CAS), Sinaia, Romania, pp. 133-136 (2016). DOI: 10.1109/SMICND.2016.7783063 - 2016 - в издания, индексирани в Scopus или Web of Science
Вид: публикация в международен форум, публикация в реферирано издание, индексирана в Scopus