Autors: Angelov, G. V., Takov, T. B., Ristic S.
Title: MOSFET Models at the Edge of 100-nm Sizes
Keywords: MOSFET models; device modeling approaches; SPICE; compact models

Abstract: The paper reviews the mainstream MOSFET advanced models with their physical relevance and mathematical techniques. The basics of the respective modeling approaches are discussed showing the principal advantages of the surface potential based approach for describing sub-100-nm devices. Major short-channel and quantum effects in the models are outlined. Emphasis is set upon the latest compact models: BSIM314, MOS Models 9/11, EKV, SP2001. Selected characteristics (such as inversion model basis, core reference, drain current and threshold voltage equations, short-channel and quantum effects, number of model parameters) of the models examined are compared as well as comments on model virtues and shortcomings are given. https://ieeexplore.ieee.org/document/1314621

References

    Issue

    Proceedings of the 24th International Conference on Microelectronics (MIEL 2004), 2004, Serbia, DOI 10.1109/ICMEL.2004.1314621

    Copyright IEEE Xplore

    Full text of the publication

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    Вид: публикация в международен форум, публикация в реферирано издание, индексирана в Scopus