Autors: Alexandrova, S., Szekeres A., Halova, E. Y.
Title: “Variable frequency C–V analysis for observation of oxide charge in MOS structures with LPCVD-silicon oxynitride film”
Keywords: C–V analysis,MOS

References

    Issue

    Journal: Comptes Rendus de L`Academie Bulgare. des Sciences, vol. 57, issue 8, pp. 15-22, 2004, Bulgaria,

    Вид: публикация в национален форум, публикация в реферирано издание