Autors: Nikolov, D. N.
Title: A case study of emission microscopy for ESD protection devices
Keywords: ESD physical mechanism, photon emission microscopy, root cause analysis, Zener diode

Abstract: The paper presents an investigation of a typical ESD protection device with a photon emission microscope. The photon emissions from a normal and failed p-n junction with tunnelling breakdown are compared. The failure is caused by the ESD event. The comparison provides root cause analysis of the ESD failure, recognition of the physical mechanism to enable further analysis of ESD failures in integrated circuits

References

    Issue

    2020 29th International Scientific Conference Electronics, ET 2020 - Proceedings, pp. 1-4, 2020, Bulgaria, DOI 10.1109/ET50336.2020.9238336

    Copyright IEEE

    Вид: публикация в международен форум, публикация в реферирано издание, индексирана в Scopus