Autors: Andonova, A. S., Atanasova N.
Title: Accelerated reliability growth of electronic devices
Keywords: Acceleration , Life estimation , Failure analysis , System testing , Electronic equipment testing , Prototypes , Mass production , Microelectronics , Phase estimation , Qualifications

References

    Issue

    27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004, vol. 24, pp. 242-246, 2004, Bulgaria, IEEE, ISBN 0-7803-8422-9/DOI: 10.1109/ISSE.2004.1490427

    Цитирания (Citation/s):
    1. J. Wan, B Chen, Q.T .Wang, Sensitivity analysis of repetitive shock machine's vibration energy, Advances in Safety, Reliability and Risk Management - Proceedings of the European Safety and Reliability Conference, ESREL 2011, pp. 2183-2188, 2012, ISBN: 978-041568379-1 - 2011 - в издания, индексирани в Scopus или Web of Science
    2. Narendra K Saini, Trust factor and reliability-over-a-period-of-time as key differentiators in IoT enabled services, 2016 International Conference on Internet of Things and Applications, IOTA 2016, Article number 7562762, pp. 411-414, ISBN: 978-150900044-9, DOI: 10.1109/IOTA.2016.7562762 - 2016 - в издания, индексирани в Scopus или Web of Science
    3. Won Jung, Hung Pham Ngoc, Accelerated Reliability Growth Model with Delayed Fixes, Journal of Society of Korea Industrial and Systems Engineering, Vol.32 No.4, 2009, pp.228-234, ISSN 2005-0461 - 2009 - от чужди автори в чужди издания, неиндексирани в Scopus или Web of Science
    4. Leiying Jiang, Multistage Accelerated Reliability Growth Testing Model and Data Analysis, University of Arkansas, Fayetteville, USA, 2014,p.111, Dissertation - 2014 - от чужди автори в чужди издания, неиндексирани в Scopus или Web of Science
    5. Pham Ngoc Hung, Won Jung, Azianti Ismail, Application of Reliability Growth in coupled with Accelerated Life Test Model, Korean Reliability Society Fall Conference 2010, At Kyonggi University, South Korea, Int. Journal of Reliability and Applications, vol.11, no 1, 2010, pp. 1-5, pISSN : 1598-0073 - 2010 - от чужди автори в чужди издания, неиндексирани в Scopus или Web of Science
    6. Azianti Ismail, Pham Ngoc Hung, Won Jung, Application of Reliability Growth in coupled with ALT model for Non-repairable System, Korean Society Industrial & System Engineering Fall Conference 2010,Int. Journal of Reliability and Applications, vol.11, no 2, 2010, pp. 1-4, pISSN : 1598-0073 - 2010 - от чужди автори в чужди издания, неиндексирани в Scopus или Web of Science

    Вид: пленарен доклад в международен форум, публикация в издание с импакт фактор, публикация в реферирано издание, индексирана в Web of Science