Autors: Krasilnikova Sytchkova, A., Grilli, M.L., Boycheva, S. V., Piegari, A.
Title: Optical, electrical, structural and microstructural characteristics of rf sputtered ITO films developed for art protection coatings
Keywords: Transparent and conductive tin-doped indium oxide films, Opt

References

    Issue

    Applied Physics A: Materials Science and Processing, vol. 89, issue 1, pp. 63-72, 2007, Germany, Springer-Verlag, DOI: 10.1007/s00339-007-4058-x

    Copyright Springer Verlag

    Цитирания (Citation/s):
    1. Srisonphan, S. Interfacial oxide defect mediated ballistic electron transport for ITO/p-Si contact (2014) 2014 11th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2014, art. no. 6839734, DOI: 10.1109/ECTICon.2014.6839734 - 2014 - в издания, индексирани в Scopus или Web of Science
    2. Lohner, T., Kumar, K.J., Petrik, P., Subrahmanyam, A., Bársony, I. Optical analysis of room temperature magnetron sputtered ITO films by reflectometry and spectroscopic ellipsometry (2014) Journal of Materials Research, 29 (14), pp. 1528-1536. DOI: 10.1557/jmr.2014.173 - 2014 - в издания, индексирани в Scopus или Web of Science
    3. Yüzüak, G.D., Coşkun, Ö.D. The effect of annealing on the structural, electrical, optical and electrochromic properties of indium-tin-oxide films deposited by RF magnetron sputtering technique (2017) Optik, 142, pp. 320-326. DOI: 10.1016/j.ijleo.2017.06.016 - 2017 - в издания, индексирани в Scopus или Web of Science
    4. Bragaglia, M., Lamastra, F.R., Tului, M., Di Gaspare, L., Notargiacomo, A., Valentini, M., Nanni, F. Low temperature sputtered ITO on glass and epoxy resin substrates: influence of process parameters and substrate roughness on morphological and electrical properties (2019) Surfaces and Interfaces, 17, art. no. 100365 DOI: 10.1016/j.surfin.2019.100365 - 2019 - в издания, индексирани в Scopus или Web of Science
    5. Ngo, H.D., Chen, K., Handegård, O.S., Doan, A.T., Ngo, T.D., Dao, T.D., Ikeda, N., Ohi, A., Nabatame, T., Nagao, T. Nanoantenna structure with mid-infrared plasmonic niobium-doped titanium oxide (2020) Micromachines, 11 (1), art. no. 23, . DOI: 10.3390/mi11010023 - 2020 - в издания, индексирани в Scopus или Web of Science
    6. Kim, H.-J., Lee, H.-H., Lee, S.-H. Analysis of Surface Roughness during Surface Polishing of ITO Thin Film Using Acoustic Emission Sensor Monitoring (2023) Coatings, 13 (12), art. no. 2086, . https://www.scopus.com/inward/record.uri?eid=2-s2.0-85180650597&doi=10.3390%2fcoatings13122086&partnerID=40&md5=680f88f58e8c767661787059e0881aec DOI: 10.3390/coatings13122086 Source: Scopus - 2023 - в издания, индексирани в Scopus или Web of Science
    7. Robb, A.J., Duca, Z.A., White, N., Woodell, P., Ward, P.A. Influence of oxygen on the optical and electrical properties of magnetron-sputtered indium tin oxide thin films at ambient temperature (2024) Thin Solid Films, 788, art. no. 140152, . https://www.scopus.com/inward/record.uri?eid=2-s2.0-85179896350&doi=10.1016%2fj.tsf.2023.140152&partnerID=40&md5=11ca3f5c6f01415e7350559782359daa DOI: 10.1016/j.tsf.2023.140152 Source: Scopus - 2024 - в издания, индексирани в Scopus или Web of Science

    Вид: статия в списание, публикация в издание с импакт фактор, публикация в реферирано издание, индексирана в Scopus и Web of Science