| Autors: Gieva, E. E., Nikolov, G. T., Nikolova, B. M. Title: Sheet Resistance Measurement of Inkjet Printed Layers Keywords: - Abstract: The Van der Pauw method is a method commonly used to measure the resistance and Hall coefficient of a sample. Its advantage lies in its ability to accurately measure the properties of a random sample, ensuring that the sample is approximately two-dimensional (i.e., it is much thinner than it is wide), rigid (without holes), and the electrodes are located on the perimeter. The Van der Pauw method uses a 4-point probe around the sample circumference, unlike the linear 4-point probe: this allows the Van der Pauw method to provide a mean resistance of the sample while the linear array provides resistance in the reading direction. [1] This difference becomes important for anisotropic materials, which can be correctly measured by the various modifications of the Van der Pauw method. References Issue
|
Цитирания (Citation/s):
1. Zikulnig, J., Roshanghias, A., Rauter, L., Hirschl, C., Evaluation of the sheet resistance of inkjet-printed ag-layers on flexible, uncoated paper substrates using van-der-pauw’s method, Sensors (Switzerland) 20(8),2398 - 2020 - в издания, индексирани в Scopus или Web of Science
2. Mohd Asri, M.A., Ramli, N.A., Nordin, A.N., Electrical performance and reliability assessment of silver inkjet printed circuits on flexible substrates, Journal of Materials Science: Materials in Electronics 32(12), pp. 16024-16037 - 2021 - в издания, индексирани в Scopus или Web of Science
3. Türkmen, D (Turkmen, Dila) ; Kalafat, MA (Kalafat, Merve Acer), Lamination curing method for silver nanoparticle inkjet printed flexible electronics: design, uncertainty and performance analysis, Volume34 Issue28 DOI10.1007/s10854-023-11220-0, Journal Of Materials Science-materials In Electronics, ISSN 0957-4522 eISSN 1573-482X, 2023 - 2023 - в издания, индексирани в Scopus или Web of Science
Вид: публикация в международен форум, публикация в реферирано издание, индексирана в Scopus
