Autors: Angelov, G. V., Nikolov, D. N., Spasova, M. L., Ruskova, I. N., Jivko Rusev., Rusev, R. P.
Title: Analysis of Experimental Data for 14-nm FinFETs
Keywords: FinFET, output characteristics, smoothness, fitting

Abstract: In this paper we analyze measurements data of different 14 nm bulk FinFET structures – both n- and p-type. The analysis is based on the smoothness of the experimental characteristics. Smoothness is important for the subsequent parameter extraction procedures. It is estimated by taking first derivatives of the experimental curves and comparing them to their fitted polynomial. Calculations have been performed in Matlab.

References

    Issue

    ET2018, 2018, Bulgaria,

    Цитирания (Citation/s):
    1. H. Liu, Sh. Wang, R. Zhao, H. Ma, Lan Ma, S. Liu, Sh. Chen and H. Liu, "Prediction of Single Event Effects in Finfet Devices Based on Deep Learning", IEEE Journal of the Electron Devices Society, 2023, DOI: 10.1109/JEDS.2023.3306746 - 2023 - от чужди автори в чужди издания, неиндексирани в Scopus или Web of Science

    Вид: публикация в международен форум, публикация в реферирано издание, индексирана в Scopus