Детайли за публикация от базата данни на ТУ - София (Publication Details)
Autors: Gadjeva, E., Mladenov, V. M. Title: Testability Analysis of Analog-Discrete Circuits Using General-Purpose Analysis Programs Keywords: testability; analog-discrete circuits; software
References
Issue
Internationalen Wissenschaftlichen Kolloquium (IWK'98), pp. 174-179, 1998, Germany,