| Autors: Ivanova, M. S., Tsenev, V. P., Mikova V. Title: An Approach for the Evaluation of a Measurement System: A Study on the Use of Machine Learning and Predictions Keywords: machine learning; semi artificial dataset; measurement Abstract: Quality control during the manufacturing process is an important factor in delivering products in electronics according to planned characteristics and properties. It concerns the capability of the chosen measurement system to perform precise and reliable measurement trials, which is evaluated mainly through the utilization of measurement system analysis. In order to reduce time effort and to partially automate these operations, a methodology for the prediction of a part of the dataset through applying the Neural Net algorithm is proposed in this paper in two scenarios: (1) when two metrology experts are involved in the measurement in three trials and the data of a third specialist are predicted and (2) when three metrology specialists collect data in two trials and the data of the third trial are predicted. The developed predictive models in these two scenarios are assessed and they are characterized by high accuracy. References Issue
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Вид: статия в списание, публикация в издание с импакт фактор, публикация в реферирано издание, индексирана в Scopus
