Autors: Gavrilov, G. M., Minkov, D. A., Angelov, G. V., E Marquez., S Ruano., E Saugar.
Title: Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum
Keywords: Increasing the Accuracy Interference Transmittance Spectrum

References

    Issue

    , 2021, Switzerland,

    Цитирания (Citation/s):
    1. Jawad, RL, Khalil, DI, Marah, RH, Thaban, B, PVA/SiO2 nanocomposite films for photovoltaic cover glass, JOURNAL OF POLYMER RESEARCH, vol 33, 2026, issn: 1022-9760, eissn: 1572-8935, art_no: ARTN 105, doi: 10.1007/s10965-026-04838-1 - 2026 - в издания, индексирани в Scopus и/или Web of Science
    2. Minkov, D, Angelov, G, Nikolov, D, Rusev, R, Ballester, M, Fernandez, S, Marquez, E, High-Accuracy Characterization of a Single Thin Film on a Substrate from One Transmittance Spectrum by an Advanced Envelope Method Addressing Voids, Tail Electron Transitions, and Deep-Level Electron Transitions in a-Si Films, NANOMATERIALS, vol 16, 2026, eissn: 2079-4991, art_no: ARTN 522, doi: 10.3390/nano16090522, pmid: MEDLINE:42117939 - 2026 - в издания, индексирани в Web of Science

    Вид: публикация в международен форум, индексирана в Scopus и Web of Science