Autors: Gavrilov, G. M., Minkov, D. A., Angelov, G. V., E Marquez., S Ruano., E Saugar.
Title: Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum
Keywords: Increasing the Accuracy Interference Transmittance Spectrum

References

    Issue

    , 2021, Switzerland,

    Вид: публикация в международен форум