Autors: Nikolov, G. T., Ruskova, I. N., Gieva, E. E., Nikolova, B. M.
Title: System for multi-frequency capacitance-voltage characterization
Keywords: C-V measurement , Device characterization , LabVIEW , Virtua

Abstract: Capacitance measurement at different DC voltage levels, different signal amplitudes and different frequencies, finds extensive application to qualify semiconductor and multiple-layered structures. Generally, the cost of such type instrumentation is in range of several thousand dollars and they are not very popular in the market. In present paper an approach of combining conventional measuring instruments and high-level programming environment is suggested in order to achieve system with complete functionalities for capacitance measurements.

References

    Issue

    26th International Scientific Conference Electronics, ET 2017, 2017, Bulgaria, IEEE, ISBN 978-1-5386-1753-3

    Цитирания (Citation/s):
    1. Nicolas Baptistat, "Etude et corrélation de l’influence des paramètres électriques sur la compatibilité électromagnétique", HAL Id: tel-03104191 https://tel.archives-ouvertes.fr/tel-03104191 Submitted on 8 Jan 2021 - 2021 - от чужди автори в чужди издания, неиндексирани в Scopus или Web of Science
    2. Vityaz O., Moskovko A., Pulse-Based Method for p-n Junction Capacitance Measurement, 2026, Proceedings IEEE International Conference on Electronics and Nanotechnology Elnano, issue 0, pp. 375-378, DOI 10.1109/ELNANO63396.2026.11601913, issn 23776935, eissn 26933535 - 2026 - в издания, индексирани в Scopus

    Вид: публикация в международен форум, публикация в реферирано издание, индексирана в Scopus и Web of Science